The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
Jan. 17, 2002
Carl Zeiss Meditec, Inc., Dublin, CA (US);
Abstract
One or more embodiments of the present invention provide a method and apparatus to determine a corneal thickness profile of an eye. In particular, one embodiment of the present invention is a corneal diagnostic instrument including: (a) a Placido ring illuminator disposed to project a Placido ring image onto a cornea to generate a reflected Placido ring image; (b) multiple slit lamp projectors disposed to project slit light beams onto the cornea to generate slit light beam images; (c) a camera system optically disposed to detect the reflected Placido ring image and the slit light beam images; and (d) a controller, coupled to the slit lamp projectors, the Placido ring illuminator, and the camera system, to cause the slit light beam images and the reflected Placido ring image to be generated and detected in a predetermined sequence, wherein the controller is responsive to the detected reflected Placido ring image and the detected slit light beam images to determine a corneal thickness profile.