The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2004
Filed:
Jul. 31, 2002
Ye-Gang Lin, Evansville, IN (US);
Vikram Gopal, Mount Vernon, IN (US);
Ronald Dale Craddock, McLeansboro, IL (US);
Michael Shoen Davis, Mount Vernon, IN (US);
General Electric Company, Pittsfield, MA (US);
Abstract
A system and method for measuring viscosity, melt flow index (MFI), and melt volume rate (MVR) of a polymer melt in real-time during an extrusion process to provide quick and accurate feedback for process control. The system includes a polymer processing rate sensor ( ), a polymer melt temperature sensor ( ), an extruder pressure sensor ( ), and a die head temperature sensor ( ) for taking in-line measurements during the extrusion process. The in-line measurements are made on the main process stream of the polymer melt, with the determination of viscosity, MFI, and MVR based on these measured values and those obtained during a calibration run with polymers having known properties. The invention can be used in any polymer compounding and extrusion process utilizing die opening with any constant geometry for monitoring quality and providing feedback for process control.