The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Dec. 14, 2000
Applicant:
Inventors:

Subbu Ganesan, Saratoga, CA (US);

Leonid Alexander Broukhis, Fremont, CA (US);

Ramesh Narayanaswamy, Mountain View, CA (US);

Ian Michael Nixon, Sunnyvale, CA (US);

Assignee:

Tharas Systems Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A functional verification system suited for verifying the function of non-cycle based integrated circuits (IC) design. The IC design is divided into a plurality of combinatorial blocks connecting sequential elements. Truth tables corresponding the divided blocks are computed and stored in a memory. The output values of the IC design are determined by evaluating the blocks. The evaluation typically entails one memory access as the truth tables are pre-computed and stored in a memory storage. Accordingly the output values are computed quickly. The storage is implemented using random access memories and a XCON is designed to ensure the dependencies are preserved during the evaluations.


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