The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Jun. 09, 2000
Applicant:
Inventors:
Assignee:
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract
A built-in self-test circuit including a signal generator and operational elements. The operational elements perform arithmetic operations on a test signal value A, generated by the signal generator, to obtain a comparison signal value A which is fundamentally equal to the test signal value A of the signal generator. By comparing the test signal value A with the comparison signal value A, a test result is obtained.
Kanehira, Yusuke. (2004). Built-in self-test apparatus (U.S. Patent No. 6691271). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6691271
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile