The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Dec. 22, 2000
Conrado Blasco Allué, Cherry Hinton, GB;
Ian Victor Devereux, Fulbourn, GB;
ARM Limited, Cambridge, GB;
Abstract
The present invention provides a technique for operating an integrated circuit comprising a plurality of circuit elements, with a plurality of serial test scan chains, each being coupled to a different one of the circuit elements. A scan chain selector is responsive to a specified scan chain specifying value to select a corresponding one of the plurality of test scan chains. A scan chain controller is also provided which has a serial interface for receiving signals from outside of the integrated circuit, the scan chain controller comprising an instruction decoder for decoding scan chain controller instructions received from the serial interface. In accordance with the present invention, the decoder is responsive to a first scan chain controller instruction to specify a pre-determined scan chain specifying value and a second scan chain controller instruction for decoding by the decoder. The provision of such a first scan chain controller instruction enables the efficiency of the testing procedure to be improved.