The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Jun. 30, 2000
Applicant:
Inventor:

Douglas Chin, Haverhill, MA (US);

Assignee:

Oak Technology, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract

An enhanced scan chain architecture includes scan cells capable of holding two sets of state data associated with the functional blocks, or “modules,” of a system (e.g., an integrated circuit, a multi-chip module, a printed circuit board, and the like), thereby rendering state data associated with a module accessible. The scan chains are employed, during normal operation, to manage (e.g., save, restore, swap, etc.) state data during multi-tasking and/or testing. Control logic redirects the input of the chain, or selected portions thereof, to a source of saved state when initiating or restoring a task; and/or redirects the output of the chain, or selected portions thereof, to a storage source when one task is interrupted and/or another task is resumed.


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