The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Sep. 19, 2000
Kyle Joseph James Mackey, Aliso Viejo, CA (US);
Matthew James Hengst, Lake Forest, CA (US);
Mark Douglas Whitener, Aliso Viejo, CA (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
Parametric data accumulation means are accumulated in a Terminal Server data file which uses a performance measurement tool program to accumulate operational data occurring in multiple client users which operate on a Terminal Server. Data is accumulated in regard to the log-on time for multiple and various different types of application programs. Each of these parameters are evaluated over a sequence of different operating conditions during periods where the parametric evaluations occur when there is a small number of client users and then over a sequence of expanded operations until there is a large number of concurrent active client users. Subsequently, the Terminal Server data file is formatted and categorized into a database which is used to create a graphical chart of performance plus specific lists of performance for each client-user correlated to each available Application Program.