The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Jan. 22, 2001
Applicant:
Inventor:

Hyeong-min Ahn, Seongnam, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

An apparatus and a method for inspecting an image, synchronizing a pattern frame synchronizing signal and an image frame synchronizing signal to initiate grabbing an inspection pattern, where the pattern frame synchronizing signal and the image frame synchronizing signal have different frequencies. With this configuration, where the frequencies of the pattern frame synchronizing signal and the image frame synchronizing signal are not identical, since grabbing an image of the inspection pattern is initiated by synchronizing the image frame synchronizing signal with the pattern frame synchronizing signal, the noise inserted into the image of the inspection pattern becomes regular, thereby resulting in enhancing the reliability of the image inspection.


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