The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Jul. 05, 2001
Applicant:
Inventors:

Terrence J. Nienaber, Pearland, TX (US);

William C. Robertson, Houston, TX (US);

Kent D. Copeland, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/320 ;
U.S. Cl.
CPC ...
G01N 2/320 ;
Abstract

The present invention is directed to a x-y-axis device and a x-y-z-axis device for micro-manipulating or positioning a crystal for x-ray diffraction. More specifically, the devices which may be placed on the head on a goniometer have small footprints (small in size). The sample may be moved and recorded in step resolutions of 1 micron over an extended range of motion.


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