The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Jul. 03, 2002
Katsusuke Shimazaki, Toride, JP;
Yoshitane Tsuburaya, Kitasouma-gun, JP;
Hitachi Maxell, Ltd., Osaka, JP;
Abstract
A magnetic lens has a reproducing layer and a magnetic slit. When the leak magnetic field Hlk of a recording magnetic domain on a recording disk exceeds the coercive force He of the magnetic slit, the magnetization in the magnetic slit is inverted into the same direction as that of the magnetization of the recording magnetic domain. Transition occurs from the in-plane magnetization to the perpendicular magnetization in a magnified area of the reproducing layer in which the temperature exceeds the critical temperature Tcr. The upward magnetization in the magnetic slit is transferred thereto. The magnetization information on the recording magnetic domain is reproduced with amplified signal intensity on the basis of the magneto-optical effect by detecting the reflected light beam of the reproducing light beam from the magnified area. A plurality of minute magnetic domains contained in an object can be detected respectively at a high sensitivity in an independent manner.