The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

May. 25, 2001
Applicant:
Inventor:

Raymond S. Konopa, Alden, NY (US);

Assignee:

Wilson Greatbatch Ltd., Clarence, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/126 ; G02B 2/100 ;
Abstract

An ergonomic adjustable microscope device comprising a second base pivotably attached to a first base positioned on a support surface is described. The device includes a mechanism for locking a microscope in a nonmovably mounted relationship on the upper surface of the second support base. Manually rotatable adjusting mechanisms located at each rearward corner of the second support base and at all four corners of the first base provide for selectively varying the rearward vertical height of the second support base and mounted microscope and the vertical height of the first base relative to the support surface, respectively, so that a user of the microscope is able to maintain a more neutral position in the neck, back, and shoulder areas.


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