The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Dec. 05, 2001
Michael D. Seltzer, Ridgecrest, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
The disclosed invention relates to a calibration method, system and apparatus for a multimetals continuous emissions monitor system (hereinafter “multimetals CEMS”). More specifically, this invention relates to a calibration scheme for continuous monitoring of mercury emissions from stationary sources by plasma emission spectrometry. A source of mercury vapor, preferably a mercury permeation tube, entrains mercury vapor into a constant flow of carrier air. The carrier air mixes with a constant flow of diluent air in an aerosol mixer. The mixer is operably coupled to the analyzer. A gaseous mixture having a calibration mercury concentration flows from the mixer into the analyzer at a constant rate. A graph having coordinates of analyzer signal intensity and mercury concentration is used to plot the calibration scheme. A first signal intensity generated by the analyzer in response to the calibration mercury concentration is used for the first plot on the graph. A second signal intensity generated by the analyzer in response to a blank having zero mercury concentration is used as the second plot on the graph. A linear relationship between the analyzer signal intensity and the mercury concentration on the graph is established from the first plot and the second plot. The slope intercept and slope are used to create a mathematical relationship between the analyzer signal intensity and the mercury concentration. This enables the analyzer to be calibrated by inserting a known mercury concentration into the analyzer and adjusting the signal intensity to conform to the signal intensity calculated from the graph or mathematical relationship.