The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Mar. 27, 2001
Applicant:
Inventors:

Takuro Tamura, Kanagawa, JP;

Jyunji Yoshii, Kanagawa, JP;

Katsuya Mizuno, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10J 3/30 ; G10N 2/176 ;
U.S. Cl.
CPC ...
G10J 3/30 ; G10N 2/176 ;
Abstract

A method for displaying microarray information by which unknown but useful information is extracted from a mass amount of sample information obtained with microarrays. Luminescent intensity information of sample spots obtained with the microarrays is standardized for each microarray and displayed as a graph as a difference from the standardized luminescent intensity of a sample spot of interest. Accordingly, information can be compared without being influenced by a difference of experiment status between the microarrays or a difference of physical properties between the samples. A three-dimensional graph is displayed by sorting the set of samples and the set of microarrays to which the sample spots belong, under predetermined conditions, and assigning the set of sorted samples and the set of sorted microarrays to X-axis and Y-axis, and the accumulated luminescence intensity to Z-axis.


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