The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Jan. 28, 2002
Applicant:
Inventors:

James M. Simkins, Park City, UT (US);

Catalin Baetoniu, Toronto, CA;

Nicholas J. Sawyer, Opio, FR;

Assignee:

Xilinx, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 1/900 ; H03K 1/9173 ; H03H 1/126 ;
U.S. Cl.
CPC ...
H03K 1/900 ; H03K 1/9173 ; H03H 1/126 ;
Abstract

Method and apparatus for data sampling is described. More particularly, a data sampling circuit having a delay line and a plurality of tap circuits is used to sample data and provide a vector indicative of a transition region of a sampled input signal. Additionally, a hybrid sampling circuit is described with a fine grain delay line and coarse grain delay lines. Furthermore, a controller is described for using such a vector to control which data samples are used.


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