The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2004

Filed:

Mar. 06, 2001
Applicant:
Inventors:

Joe David Jones, Austin, TX (US);

Mitchell K. Alsup, Austin, TX (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/226 ;
U.S. Cl.
CPC ...
G01R 3/226 ;
Abstract

A new system and method for high-speed testing of semiconductor devices is disclosed. The system utilizes bi-directional FET switches to hide the delay related to the distance signals have to travel between the test head electronics and the device under test. The effect is to increase the frequency with which a prior art tester can test a device. By placing the FET switches closer to the device under test, the device operates on the tester in the same electrical environment as it would in actual use. The device under test can be switched from receiving an input signal to driving an output signal in less time than the TL delay between the test head electronics and the device under test.


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