The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Dec. 06, 2000
Applicant:
Inventors:
Michael L. Watkins, Chester, VA (US);
Grier S. Fleischhauer, Midlothian, VA (US);
A. Clifton Lilly, Jr., Chesterfield, VA (US);
Assignee:
Philip Morris Incorporated, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 ; G01N 2/572 ;
U.S. Cl.
CPC ...
G01J 5/02 ; G01N 2/572 ;
Abstract
A method and apparatus for detecting, locating, isolating and controlling variations in the manufacturing process by transient thermography. A heat source ( ) imparts heat to a surface which is radiated in the infrared region. Infrared sensors ( ) are coupled to a processor which tracks the physical characteristics of the sample, and provides feedback to a central process controller to make adjustments to the manufacturing process. The sample can be a continuous product such as a green powder metal sheet or tobacco product.