The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Oct. 24, 2001
Applicant:
Inventors:
Junichi Nakai, Kobe, JP;
Takashi Onishi, Kobe, JP;
Hideo Fujii, Kobe, JP;
Katsutoshi Takagi, Kobe, JP;
Assignee:
Kabushiki Kaisha Kobe Seiko Sho, Kobe, JP;
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 ;
U.S. Cl.
CPC ...
B32B 3/02 ;
Abstract
A novel reflective layer or semi-transparent reflective layer for use in optical information recording media with suppressed growth of Ag crystal grains and having a high reflectivity and excellent structural stability comprising an Ag based alloy containing from 0.1 to 3.0% of Nd in total of at least one element selected from the group consisting of Nd, Sn and Ge; and/or containing 0.1% or more of at least one rare earth element.
Nakai, Junichi. (2004). Reflection layer or semi-transparent reflection layer for use in optical information recording media, optical information recording media and sputtering target for use in the optical information recording media (U.S. Patent No. 6689444). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6689444
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile