The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2004
Filed:
Oct. 29, 1999
William D. Fisher, San Jose, CA (US);
Henrique A. S. Martins, Cupertino, CA (US);
Peter G. Webb, Menlo Park, CA (US);
Agilent Technologies, Ind., Palo Alto, CA (US);
Abstract
An apparatus and method are provided for producing and inspecting a plurality of deposited features in a pattern on a portion of a substrate surface, as in an oligonucleotide array. The apparatus comprises a printhead for depositing a fluid to form the array of features on the substrate surface and a camera for imaging the deposited features. The apparatus also comprises a printhead controller for positioning and activating the inkjet printhead to deposit the array features. The camera, e.g., a digital line scan camera, is controlled by a camera controller such that the camera acquires images corresponding to substantially only the portion of the surface on which features should have been deposited. The camera and printhead are preferably situated such that an induced movement of the printhead relative to the substrate results in a substantially identical corresponding movement of the camera. Optionally, the apparatus further comprises means for comparing an image acquired by the camera with a predetermined standard to produce a signal.