The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6688906 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 10, 2004

Filed:

May. 28, 2002
Applicant:
Inventor:

David Nelson Kimbley, Colorado Springs, CO (US);

Assignee:

Agilent Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 1/118 ;
U.S. Cl.
CPC ...
H01R 1/118 ;
Abstract

Probes and methods for testing electrical circuits are provided. One such probe includes a conductive socket, a conductive spring, and a housing that guides the conductive spring to the conductive socket to form an electrical connection between the spring and the socket. Once such method includes providing a conical housing and a spring and guiding the spring to the socket via the conical housing. The guiding step ensures that the spring contacts the socket during assembly and, therefore, ensures that a conductive path from the socket to the spring is provided. Methods and other probes are also provided.


Find Patent Forward Citations

Kimbley, David. (2004). Probes and methods for testing electrical circuits (U.S. Patent No. 6688906). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6688906

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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