The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2004

Filed:

Dec. 29, 2000
Applicant:
Inventor:

Stanley Edward Jaffe, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 5/00 ;
U.S. Cl.
CPC ...
G09G 5/00 ;
Abstract

A signal analyzer has a display with two regions. In a first region there is displayed a first waveform representing a signal. The first waveform is shown in two dimensions. One dimension represents signal amplitude and one dimension represents signal frequency. In a second region is displayed a second waveform. The second waveform represents a subset of data points of the first waveform. The second waveform also is shown in two dimensions. One dimension represents signal amplitude and one dimension represents signal frequency.


Find Patent Forward Citations

Jaffe, Stanley. (2004). Enhanced signal analysis in an amplitude versus frequency format (U.S. Patent No. 6687628). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6687628

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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