The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Apr. 22, 2002
Applicant:
Inventors:
Seshadri Srinivasan, Houston, TX (US);
Jonathan Ophir, Austin, TX (US);
Assignee:
The Board of Regents of the University of Texas System, Austin, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 3/00 ;
U.S. Cl.
CPC ...
G01L 3/00 ;
Abstract
The present invention is directed toward an apparatus and method for determining localized strain in a target body by identifying sets of features in reflected echo sequences and by comparing sets of features to determine time shift values between features.