The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Feb. 21, 2002
Applicant:
Inventors:
Abha Moitra, Westwood, MA (US);
Robert M. Mattheyses, Schenectady, NY (US);
Robert J. Szczerba, Endicott, NY (US);
Louis J. Hoebel, Burnt Hills, NY (US);
Virginia A. Didomizio, Latham, NY (US);
Boris Yamrom, Bronx, NY (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 1/300 ;
U.S. Cl.
CPC ...
G01S 1/300 ;
Abstract
A method analyzes a plan for scanning the content of a predetermined area. The method includes the steps of: providing a plan for at least one entity ( ), the plan including a route and a set of scan points; and assigning an associated score for the plan in order to compare the plan to other plans, the score indicating the quality of the plan.