The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Jul. 27, 1999
Pentax Corporation, Tokyo, JP;
Abstract
The image pick-up device picks up an image of the inspection target optical member whenever it rotates a predetermined angle. The image data which is output by the image pick-up device picking-up the image undergoes coordinate transformation from polar coordinate system to rectangular coordinate system and thereafter binarization process. The area of the defective candidate objects which are extracted from the image data in two color system obtained through the binarization process are normalized in accordance with the reference values prepared for each region in which said defective candidate objects formed within the image data. The points which are calculated as a result of this normalization, are added to the corresponding columns in the classification table. It is judged whether the inspection target optical member is satisfactory or not, in accordance with whether or not evaluation function calculated on the basis of the value in each column exceeds a predetermined reference value.