The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Mar. 14, 2002
Klaus Bavendiek, Norderstedt, DE;
Jürgen Bauer, Hamburg, DE;
Yxlon International X-ray GmbH, Hamburg, DE;
Abstract
The present invention relates to a method and an apparatus for the testing or inspection of objects, particularly for detecting defects or irregularities therein, by means of X-radiation, where the object to be inspected is brought into different spatial positions and stays there during image detection. For mechanical positioning of the objects, known methods and apparatuses require a relatively long time with limited inspection precision, while having a considerable space requirement. Accompanied by a small size, the invention obviates this problem in that the X-ray components, comprising X-ray tube and X-ray detector, are only moved in translatory manner and the inspection object or part in a gimbal suspension is only moved in rotary manner in at least one axis and a maximum of three axes x, y and z.