The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 2004
Filed:
Dec. 20, 2001
Applicant:
Inventors:
Stephen B. Ippolito, Tampa, FL (US);
M. Selim Unlu, Jamaica Plain, MA (US);
Bennett B Goldberg, Newton, MA (US);
Assignee:
The Trustees of Boston University, Boston, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/102 ;
U.S. Cl.
CPC ...
G02B 2/102 ;
Abstract
A viewing enhancement lens ( -NAIL) which functions to increase the numerical aperture or light gathering or focusing power of viewing optics such as a microscope ( ) used to view structure within a substrate such as a semiconductor wafer or chip or of imaging optics such as media recorders. The result is to increase the resolution of the system by a factor of between n, and n , where n is the index of retraction of the lens substrate.