The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2004

Filed:

Apr. 04, 2002
Applicant:
Inventors:

Peter Reiser, Waldbronn, DE;

Robert Benko, Straubenhardt-Conweiler, DE;

Hans Martin Schwenk, Straubenhardt, DE;

Assignee:

Schroff GmbH, , DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/728 ; G01R 2/704 ;
U.S. Cl.
CPC ...
G01R 2/728 ; G01R 2/704 ;
Abstract

Arrangement to test HF tightness of a junction between two adjacent parts including HF generator ( ), HF line that guides the signal over junction ( ), measuring device ( ) as well as a signal analyzer. HF line includes two waveguides ( ) that have inner conductors ( ) connected all the way through by a connection conductor ( ) and outer conductors ( ) interrupted and each connected with electrodes ( ). A capacitive coupling of the HF signal occurs on one side of the junction and a capacitive decoupling of the HF signal takes place on the other side. By comparing the measured transmission and/or reflection of the HF signal with a transmission or reflection characteristic for the junction, it can be determined if the junction is HF tight. This makes it possible to test HF shielded cases for HF tightness in a non-destructive manner and without interfering with the contents.


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