The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2004
Filed:
Apr. 04, 2002
Trent Ridder, Sandia Park, NM (US);
John D. Maynard, Albuquerque, NM (US);
Russell E. Abbink, Albuquerque, NM (US);
Robert D. Johnson, Albuquerque, NM (US);
Inlight Solutions, Inc., Albuquerque, NM (US);
Abstract
An optical sampling subsystem and method that reduces the effect of errors in an optical sampling subsystem when heterogeneously distributed samples are measured in the path of a spectrometer. The optical sampling subsystem is used to collect the non-uniformly distributed radiation exiting the heterogeneous sample and produce a uniform irradiance at its output. The output is then directed into the wavenumber (inverse of wavelength in centimeters) dispersive or modulating device of the spectrometer. The resulting spectra exhibit less spectral complexity arising from components of the sampling subsystem design and the heterogeneous sample, in particular, the effect of wavenumber shift is minimized. Improved quantitative predictions, qualitative analysis and calibration transfer are direct consequences of the reduced spectral complexity.