The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2004
Filed:
Nov. 16, 2000
Other;
Abstract
An image defect detection apparatus includes: an image acquisition section for acquiring an image as image data; a check section for checking for the presence or absence of a defect in the image, the defect being of one of a plurality of different types. The check section includes: a matrix setting subsection for setting, within the acquired image, an inspection reference region and an inspection region in accordance with each type of defect; a comparison value extraction subsection for extracting a comparison value based on image data in the inspection reference region and image data in the inspection region as set by the matrix setting subsection; and a comparison subsection for determining the presence or absence of the defect based on a comparison between the comparison value extracted by the comparison value extraction subsection and a predetermined threshold value.