The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2004
Filed:
Apr. 10, 2002
Baker Hughes Incorporated, Houston, TX (US);
Abstract
The invention relates to refractometry and attenuated reflectance spectrometry in a wellbore environment. Specifically, it pertains to a robust apparatus and method for measuring refractive index of fluids along a continuum (rather than in steps), and for measuring attenuated reflectance spectra, and for interpreting the measurements made with this apparatus to determine a variety of formation fluid parameters. The present invention provides a method and apparatus to distinguish between gas and liquid based on the much lower index of refraction of gas. It can also be used to monitor fluid sample clean up over time. The refractive index of a wellbore fluid is determined from the fraction, R, of light reflected off the interface between a transparent window that has a known refractive index and this fluid. Preferably, the refractive index is measured at some wavelength of light for which the fluid is not highly attenuating. However, the adjacent transmission spectrometer can be used to correct the refractive index measurement for attenuation at those wavelengths, which it monitors. Also, this reflection-based refractometer design can be used as an attenuated reflectance spectrometer at highly attenuating wavelengths.