The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2004

Filed:

Mar. 18, 1998
Applicant:
Inventors:

Jun Takayama, Hachioji, JP;

Naruo Takizawa, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/64 ; H04N 5/232 ;
U.S. Cl.
CPC ...
H04N 9/64 ; H04N 5/232 ;
Abstract

Photographing for one image plane is conducted by CCD under the completely dark condition created by closing aperture when the power supply is turned on, then image data obtained from this photographing are compared with a threshold value, and when the image data show higher luminance than the threshold value, the image data are detected to be defective pixels (white flaws) and positional information thereof is stored. Further, under the condition that the mode for detecting defective pixels is selected by mode switch , photographing for one image plane is conducted by CCD while a camera is directed to an exclusive subject, then image data obtained through this photographing are compared with a threshold value, and when the image data show lower luminance than the threshold value, the image data are detected to be defective pixels (black flaws), and positional information thereof is stored. In ordinary photographing, a mean value of peripheral pixels surrounding the image data of the defective pixel is used for replacement based on positional information of the defective pixel.


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