The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 2004
Filed:
Oct. 06, 1998
Yoshiki Yanagisawa, Tokyo, JP;
Nobuaki Takeuchi, Tokyo, JP;
Jun Kikuchi, Tokyo, JP;
Yoshio Endou, Tokyo, JP;
Mitsuru Shinagawa, Tokyo, JP;
Tadao Nagatsuma, Tokyo, JP;
Kazuyoshi Matsuhiro, Tokyo, JP;
Other;
Abstract
An electro-optic sampling apparatus is provided to enable measurement on potentials of signals on the conductor of coaxial cable with high precision and with ease. Herein, an electric input connector inputs a measured electric signal, which is introduced to a conductive path such as a microstrip line. An electro-optic material (e.g., Bi SiO ) that provides electro-optic effect such as Pockel's effect is fixed to a bare portion of the conductive path and is varied in birefringence ratio in response to strength of electric field caused by the conductive path through which the measured electric signal transmits. The conductive path is then terminated by a terminal device. Now, a laser beam is radiated toward the electro-optic material, wherein it is varied in polarization in response to variations of the birefringence ratio. Then, the laser beam is reflected by a dielectric mirror and is separated into two beams by a polarization beam splitter. Photodiodes are provided to convert the two beams to electric signals representing potentials. Thus, the apparatus measures voltage of the measured electric signal based on the electric signals.