The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2004

Filed:

Sep. 17, 2001
Applicant:
Inventors:

Vladimir M. Doroshenko, Ellicott City, MD (US);

Victor V. Laiko, Ellicott City, MD (US);

Mikhail Yakshin, Ellicott City, MD (US);

Coorg R. Prasad, Silver Spring, MD (US);

Hyo Sang Lee, Silver Spring, MD (US);

Assignee:

Science & Engineering Services, Inc., Burtonsville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 4/916 ;
U.S. Cl.
CPC ...
H01J 4/916 ;
Abstract

A method, system, and apparatus for mass spectroscopic analysis of an analyte solution in which a liquid volume of the analyte solution is irradiated with a light source resulting in desorption of solution-specific ions into a surrounding gas to produce gas-phase ions, the gas-phase ions are transferred to an inlet port of a mass analyzer, and the gas-phase ions are mass analyzed. More specifically, the apparatus may include a laser configured to pulse irradiate a surface of the analyte solution, a mass spectrometer configured to mass-analyze the gas-phase ions according to the mass-to-charge ratio, and a transfer mechanism configured to transfer the gas-phase ions to an inlet port of the mass spectrometer.


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