The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6681622 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 27, 2004

Filed:

Oct. 31, 2002
Applicant:
Inventors:

Bethanne L. Valentine, Freeland, MI (US);

Lawrence C. Stanos, Midland, MI (US);

Bryan L. Ackerman, Freeland, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 0/356 ;
U.S. Cl.
CPC ...
G01N 0/356 ;
Abstract

A device implements a method of determining a cut resistance of a sample. The device includes a blade wherein the blade and the sample are relatively movable and a first apparatus that transfers energy to at least one of the sample and the blade to cause relative movement thereof in a direction parallel to a surface of the sample such that the blade contacts and cuts the sample until the imparted energy is expended and relative movement is terminated. A second apparatus measures a parameter of the relative movement to obtain an indication of the cut resistance of the sample.


Find Patent Forward Citations

Valentine, Bethanne. (2004). Device for and method of determining cut resistance of a material (U.S. Patent No. 6681622). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6681622

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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