The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2004

Filed:

Jul. 07, 1999
Applicant:
Inventors:

Kenichi Moriguchi, Neyagawa, JP;

Toshihisa Ikeda, Kyoto, JP;

Yuji Mizuguchi, Kyoto, JP;

Takahisa Sakai, Amagasaki, JP;

Toshikazu Hattori, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/16 ;
U.S. Cl.
CPC ...
H04J 1/16 ;
Abstract

In a network of a topology of a loop and a bus, occurrence of a failure is detected and a location of the failure is specified. Occurrence of the failure is detected by detecting that a specific signal pattern to be received at regular time intervals within a fixed time period is not received. A node which has detected occurrence of the failure transmits or receives a specifying signal among the nodes, and decide whether or not the failure has occurred adjacently to itself. A packet indicating a decided location of the failure is transmitted or received among nodes, and thereby respective nodes specify the location of the failure. When the failure has occurred at the master node, a node having a smallest node ID after waiting time according to the node ID operates as the alternative master node.


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