The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2004
Filed:
Nov. 17, 2000
Applicant:
Inventors:
Larry D. Seiler, Boylston, MA (US);
Yin Wu, Somerville, MA (US);
Hugh C. Lauer, Concord, MA (US);
Vishal C. Bhatia, Arlington, MA (US);
Jeffrey Lussier, Woburn, MA (US);
Assignee:
TeraRecon, Inc., San Mateo, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06T 1/700 ;
U.S. Cl.
CPC ...
G06T 1/700 ;
Abstract
A volume data set composed of voxels is rendered onto an image plane composed of pixels by casting a ray through each pixel of the image plane. A surface of the volume data set is selected as a base plane. Sample points are defined along each ray so that the sample points lie in planes parallel to the base plane. Voxels adjacent to each sample point are sampled to determine a sample value for each sample point, and the sample values of each ray are combined to determine a pixel value for each pixel.