The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2004

Filed:

May. 15, 2002
Applicant:
Inventor:

James Craig Smith, Farmington Hills, MI (US);

Assignee:

Delphi Technologies, Inc., Troy, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/900 ; G05B 1/302 ;
U.S. Cl.
CPC ...
G01R 2/900 ; G05B 1/302 ;
Abstract

A method for detecting steady-state convergence of a signal compares a filtered version of the signal or its derivative to a threshold over a given time interval, and a measure of the signal variability is used to tune the filter behavior. In one implementation, the signal is filtered with a high-pass filter, and the cut-off frequency of the filter is adjusted inversely with respect to the measured variability of the signal. In another implementation, the signal derivative is filtered with a low-pass filter, and the cut-off frequency of the filter is adjusted in proportion to the measured variability of the signal. In each case, the variability of the signal is measured by computing a differential of the signal and then smoothing the differential.


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