The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2004
Filed:
Jun. 06, 2001
Applicant:
Inventor:
Warren C. Oliver, Knoxville, TN (US);
Assignee:
MTS Systems Corporation, Eden Prairie, MN (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/00 ;
U.S. Cl.
CPC ...
G01N 3/00 ;
Abstract
A material testing system includes a base and first and second specimen holders. A first displacement sensor measures displacement of the first specimen holder relative to the base. In addition, a second displacement sensor measures displacement of the second specimen holder relative to the base.
Quick Actions:
Oliver, Warren. (2004). Statistically rigid and dynamically compliant material testing system (U.S. Patent No. 6679124). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6679124
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