The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2004
Filed:
May. 30, 2001
David B. Board, Boca Raton, FL (US);
Swantech, LLC, Fort Lauderdale, FL (US);
Abstract
A sensor for detecting stress waves for use in a stress wave analysis system. The stress waves are preferably detected in a narrow frequency range of 35-40 KHz. At this range, stress waves from friction and impact sources typically propagate through machine structures at detectable amplitudes. In order to maximize the signal to noise ratio of stress waves, relative to background noise and vibration, the sensor of the present invention is designed and calibrated with a frequency response and damping features that are specifically tailored for stress wave analysis. The sensor is a multi-functional sensor that can measure a number of logically related parameters for indicting the mechanical condition of a machine. It is often desirable to measure both friction and one or more other parameters appropriate for indication of a machine's health, where all of the measuring capability is contained in one sensor. The multi-functional capability of the present invention significantly reduces the acquisition, installation, and maintenance costs of the condition monitoring instrumentation system.