The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Apr. 27, 2001
John F. Wendt, Columbus, OH (US);
Ulrich Lang, Upper Arlington, OH (US);
Leeman D. Spradlin, Columbus, OH (US);
Ronald N. Geiger, Columbus, OH (US);
James Ronald Fry, Columbus, OH (US);
Stephen J. Kiernan, Columbus, OH (US);
Automation and Control Technology, Inc., Columbus, OH (US);
Abstract
A system and method for frequent and accurate measuring of flat sheet thickness on a process line is disclosed. The results of the monitoring process of the present invention may be used to adjust the production process to better remain within predetermined tolerances. Data collection, data analysis, and process control are accomplished using a plurality of software applications in communication with various devices and equipment that support these functions of the present invention. A source/dectector unit collects data during the production process. The data is transmitted, manipulated, analyzed, and compared for conformance to tolerances and error signal output is transmitted to a process control system used to control the production process. If the sheet product is outside a specified tolerance range, an operator may also be notified so that corrective actions can be taken. Software applications may be used by an operator to perform setup and configuration operations.