The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Nov. 06, 2001
Raymond J. Bunkofske, South Burlington, VT (US);
John Z. Colt, Jr., Williston, VT (US);
James J McGill, Fishkill, NY (US);
Nancy T. Pascoe, South Burlington, VT (US);
Maheswaran Surendra, Croton-on-Hudson, NY (US);
Marc A. Taubenblatt, Pleasantville, NY (US);
Asif Ghias, San Francisco, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and structure for controlling a manufacturing tool includes measuring different manufacturing parameters of the tool, transforming a plurality of time series of the manufacturing parameters into intermediate variables based on restrictions and historical reference statistics, generating a surrogate variable based on the intermediate variables, if the surrogate variable exceeds a predetermined limit, identifying a first intermediate variable, of the intermediate variables, that caused the surrogate variable to exceed the predetermined limit and identifying a first manufacturing parameter associated with the first intermediate variable, and inhibiting further operation of the tool until the first manufacturing parameter has been modified to bring the surrogate value within the predetermined limit.