The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Aug. 27, 2001
Jin-Han Kim, Kumi-shi, KR;
Sung-Koog Oh, Kumi-shi, KR;
Yong-Woo Park, Seoul, KR;
Un-Chul Paek, Kwangju-kwangyeok-shi, KR;
Dug-Young Kim, Kwangjukwangyok-shi, KR;
Samsung Electronics Co. Ltd., Suwon, KR;
Abstract
An apparatus and method for measuring residual stress and photoelastic effect of an optical fiber is disclosed. The apparatus includes a rotating light diffuser for providing temporally averaged uniform image by restraining spatial coherence of light emitted from a light source to be completely scattered, a collecting lens for aligning the light passed through the rotating light diffuser in an optical fiber, a linear birefringence device for linearly controlling the polarization state of the aligned light input from the collecting lens, a condenser for condensing the light passed through the linear birefringence device on a place where the optical fiber is located, a fixed polarizer for transforming the polarization state of the light passed through the optical fiber to the intensity distribution by allowing the light emitted from the linear birefringence device to transmit the optical fiber, an objective lens for obtaining a magnified optical fiber image having the intensity distribution of the light transmitted the optical fiber, and a unit for measuring transmittance variation given to the optical fiber depending on locations.