The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2004

Filed:

Mar. 13, 2000
Applicant:
Inventors:

Timothy J. Trenary, Fort Collins, CO (US);

Joan L. Mitchell, Longmont, CO (US);

Charles A. Micchelli, Mohegan Lake, NY (US);

Marco Martens, Chappaqua, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/36 ; G06K 9/32 ;
U.S. Cl.
CPC ...
G06K 9/36 ; G06K 9/32 ;
Abstract

A one-dimensional algorithm for perform the merging of complementary portions from two independent overlapped images on the same 8×8 grid without the computational expense of conversion to and from the real domain is extended to a two-dimensional procedure. The merging process is performed exclusively in the frequency domain. The extension to two dimensions is done by shifting and/or merging rows of side-by-side two-dimensional transformed data blocks using the one-dimensional algorithm. Then a vertical shifting and/or merging can be performed on the horizontally shifted and/or merged blocks again using the one-dimensional algorithm with an independent shift/merge parameter.


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