The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Mar. 27, 2000
Rikk Crill, Longmont, CO (US);
Look Dynamics, Inc., Longmont, CO (US);
Abstract
An optical image characterizer detects light energy as discrete angular orientations of a slit in a rotating spatial filter positioned at the focal plane of a Fourier transform lens, where a Fourier transform pattern of spatial frequencies of an image are formed. Detection of light energy with a small array (e.g., 16×16) photodetector is enhanced by splitting the beam containing the filtered light energy pattern and projecting it onto two photodetector arrays in offset, virtual juxtaposed relation to each other. Detected light intensities I at discrete angular orientations R are stored in RIXel data arrays with or without searchable flags X, such as distortion factors.