The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2004

Filed:

Mar. 12, 2003
Applicant:
Inventors:

Rolf Holger Wolters, Honolulu, HI (US);

Joseph Allen Sweat, Honolulu, HI (US);

Michael James Deweert, Kailua, HI (US);

Robert Benton Seiple, Jr., Kailua, HI (US);

David George Shibasaki Walton, Honolulu, HI (US);

Assignee:

STI Medical Systems, Inc., Honolulu, HI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

The invention provides a device and process for real-time screening of areas that can be identified as suspicious either through image segmentation utilizing image processing techniques or through treatment with an exogenous fluorescent marker that selectively localizes in abnormal areas. If screening detects a suspicious area, then the invention allows acquiring of autofluorescence images at multiple selected narrow differentiating spectral bands so that a “virtual biopsy” can be obtained to differentiate abnormal areas from normal areas based on differentiating portions of autofluorescence spectra. Full spatial information is collected, but autofluorescence data is collected only at the selected narrow spectral bands, avoiding the collection of full spectral data, so that the speed of analysis is increased.


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