The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Feb. 22, 2002
Applicant:
Inventors:
Rainer Graumann, Hoechstadt, DE;
Joachim Hey, Nuremberg, DE;
Assignee:
Siemens Aktiengesellschaft, Münich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/28 ;
U.S. Cl.
CPC ...
H05G 1/28 ;
Abstract
In a method applied and an x-ray system for determining a spatial relationship of X-ray datasets measured independently of one another, an x-ray apparatus registers X-ray datasets of a patient and a scale is provided that makes position data available that are identifiable in at least one of the registered dataset. The position data serve for the determination of the spatial relationship between at least two X-ray datasets that were registered from different body portions of the patient.