The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6678350 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 13, 2004

Filed:

Sep. 25, 2001
Applicant:
Inventors:

Enrico Dolazza, Boston, MA (US);

James G. Coffin, Hudson, MA (US);

Assignee:

Analogic Corporation, Peabody, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/64 ;
U.S. Cl.
CPC ...
H05G 1/64 ;
Abstract

A method of improving the signal to noise ratio associated with the output of a digital x-ray detector receiving bi-chromatic x-ray energy includes acquiring a first image from the detector corresponding to x-ray energy at a first energy level, and scaling the first image with a first scaling factor so as to produce a scaled first image. The method further includes acquiring a second image from the detector corresponding to x-ray energy at a second energy level, and scaling the second image with a second scaling factor so as to produce a second scaled image. The method also includes combining the first scaled image and the second scaled image so as to form a compensated image.


Find Patent Forward Citations

Dolazza, Enrico. (2004). Method of and system for improving the signal to noise characteristics of images from a digital x-ray detector receiving bi-chromatic x-ray energy (U.S. Patent No. 6678350). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6678350

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