The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
May. 01, 2002
Applicant:
Inventors:
Nelson Tabirian, Winter Park, FL (US);
Sarik Nersisyan, Winter Park, FL (US);
Assignee:
Beam Engineering for Advanced Measurements Co., Winter Park, FL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/00 ;
U.S. Cl.
CPC ...
G01J 1/00 ;
Abstract
The objective of the present invention is providing a method and a simple instrument that can be used on a routine basis to accurately and quickly measure the focus position, waist radius, divergence, quality, power and power density of a laser beam. The measurement is performed by scanning a thin film of a nonlinear optical material in the focal region along the propagation direction of the beam and registering the variation of the on-axis intensity of the laser beam by a photodetector.