The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2004

Filed:

May. 23, 2002
Applicant:
Inventor:

Edoardo Charbon, Berkeley, CA (US);

Assignee:

Canesta, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01C 3/08 ; B01S 1/308 ;
U.S. Cl.
CPC ...
B01C 3/08 ; B01S 1/308 ;
Abstract

High dynamic range brightness information is acquired by inputting detection current to a high (adjustable) gain resettable integrator whose output V(t) is compared to a Vth threshold by a comparator whose output is counted by a reset counter as V(t)≧Vth. When a desired count is attained, data acquisition ends, the counter is read, and the entire circuit is reset. A TOF data acquisition circuit includes first and second sequences of series-coupled delay units, and a like number of latch units coupled between respective delay units. A phase discriminator compares output from each chain and feedback a signal to one of the chains and to a comparator and can equalize delay through each chain. A control voltage is coupled to the remaining chain to affect through-propagation delay time. The latch units can capture the precise time when V(t)≧Vth. Successive measurement approximation can enhance TOF resolution.


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