The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
Jan. 02, 2003
Applicant:
Inventor:
Robert T. Frankot, Tucson, AZ (US);
Assignee:
Raytheon Company, Waltham, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/390 ;
U.S. Cl.
CPC ...
G01S 1/390 ;
Abstract
Signal processing methods useful in single-antenna multiple-pass interferometric synthetic aperture radars. The signal processing methods compute an initial elevation estimate from the phase difference between a pair of images (A , A ) with a relatively small elevation angle difference (i.e., a short interferometric baseline) and uses it to initialize the elevation estimation process for pairs of images (A , A ) with longer interferometric baselines. The method may be used to process images that are coherent, or not necessarily mutually coherent. The outputs of the methods comprise a terrain elevation map that mitigates for atmospheric error and a turbulence map.