The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2004
Filed:
May. 30, 2002
Donald J. Geisel, Clifton Park, NY (US);
Other;
Abstract
A material analyzing apparatus and associated method for analyzing. The apparatus comprises an analyzer body that contains a generally insulative material casing; a material analyzing circuitry that includes a transmitter, a receiver, and a control; an antenna system that includes a transmitting antenna, a receiving antenna, and a ground layer; a coupling structure that couples the antenna system to the material analyzing circuitry. The transmitter of the material analyzing circuitry generates a electromagnetic wave signal that is adapted to be sent by the transmitting antenna and directed into the material to be analyzed. The receiving antenna receiving any returned signal from the material and send the returned signal to the receiver and control. The control then analyzes the signal for material characteristics, including at least one of density, material segregation, and moisture.